---
title: TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope (SEM)
url: https://opti-tech.ca/product/scanning-electron-microscope-tabletop/
date: 2021-03-05T17:42:14+00:00
modified: 2026-06-02T17:18:44+00:00
lang: en_CA
---

# TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope (SEM)

There is a wide range of advanced electron microscopes such as Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM), Field-Emission Scanning Electron Microscopes (FE-SEM), Biological and Analytical Transmission Electron Microscopes (TEM), Scanning Transmission Electron Microscopes (STEM), and Tabletop Scanning Electron Microscopes. With overwhelming choices, we offer expertise in Tabletop Scanning Electron Microscopes.

##### Why Tabletop SEM?

Tabletop Scanning Electron Microscopes (SEM) feature improved electron optics, higher magnification, and built-in image processing to further enhance image quality and resolution. Tabletop microscopes offer an immediate micro-world experience with the convenience of a light microscope. In other words, you receive the abilities of a larger SEM but in a compact format that fits smaller workspaces. Additionally, with low vacuum imaging capabilities, even non-conductive samples, can be promptly observed without a metal coating.

# TM4000III/TM4000Plus III

## #compact #powerful #innovative

The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes ™ integrates ease of use, optimized imaging, and high-image quality while maintaining the compact design of well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000III and TM4000Plus III.

##### Image Quality You Can See

Quality images can be obtained with simple steps.

- Automation, observation, and elemental analysis
  - Easy to switch images with one-click
  - Rapid acquisition of elemental maps (optional)
- Intuitive operation on Camera Navi (optional)
  - The use of optical images helps navigate to the target observation area easily
  - Obtained SEM images can be layered on an SEM MAP image
- Simply select images and a template to create customized reports
  - Created reports can be saved/edited in Microscope Office formats

##### Vacuum Status

You receive various imaging applications using 4-under low vacuum status. With a charge-up reduction mode, your charge on a sample can be reduced with a single click. Under the low vacuum condition, you can examine a variety of materials as images show observations of non-conductive samples such as ink toner particles or a hydrated leaf surface. You can use various imaging applications using 4-under low vacuum status with innovative secondary-electron detectors. The secondary-electron detectors obtain surface detail with non-conductive samples at lower vacuum conditions. The TM4000Plus III can observe not only conductive samples but also non-conductive or hydrated samples without sample preparation. Switching between BSE and SE can be performed easily. Hitachi’s high-sensitivity low vacuum SE Detector (UVD) generates secondary-electron images by detecting visible light excited by electron gas interactions.

##### Accelerating Voltage

The advantages of 20 kV accelerating voltage enables you to have a higher-speed EDS analysis. EDS mapping data at 20kV is completed in just 2 minutes.

##### The Options

- Multi Zigzag
  - A function that takes multiple high magnification images and stitches them together to create a single high-resolution image
  - You can set matrix parameters for image array such as field of view, number of images, pitch, and overlay from the menu.
- STEM holder
  - Easily obtain transmitted images on thin samples
  - The newly developed STEM holder can be used to perform transmission images with the Hitachi UVD
  - Images of thin or biological samples can be obtained