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FS70 Microscope Head

The Mitutoyo series of FS70 microscope heads for semiconductor inspection function as optimum compact microscope units for semiconductor probe stations. Capable of magnifications up to 8,000x and working distances up to 34mm, our microscope heads are ideal for inspection and quality assurance applications.

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Ergonomic High-Power Inspection

The FS70 finescope unit from Mitutoyo is compatible with YAG lasers and infrared optical systems. With an inward turret design and long working-distance objectives, our compact microscope units yield high magnifications for various semiconductor inspection applications.

  • Ergonomic high-power units for semiconductor observation
  • Available for a wide range of observations
  • Compatible with infrared optical systems

Product Series

Microscope Head for Semi Conductor Inspection

Microscope Head for Semi Conductor Inspection

Ergonomic High-power Semiconductor Inspection Microscope Unit
Microscope Head with 1-2X Zoom for Semi Conductor Inspection

Microscope Head with 1-2X Zoom for Semi Conductor Inspection

Ergonomic High-power Semiconductor Inspection Microscope Unit
Microscope Head for Semi Conductor Inspection - Laser Applications at 355nm | 532nm and 1064nm

Microscope Head for Semi Conductor Inspection ( Laser Applications at 355nm, 532nm, and 1064nm )

Ergonomic High-power Semiconductor Inspection Microscope Unit
Microscope Head for Semi Conductor Inspection Laser Applications at 266nm and 532nm

Microscope Head for Semi Conductor Inspection ( Laser Applications at 266nm and 532nm )

Ergonomic High-power Semiconductor Inspection Microscope Unit

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