Scanning Electron Microscope (SEM) Tabletop

Easy and Intuitive Operation

  • Optical navigation, image capture, report generation obtained quickly and easily with simplified workflow
  • No special EM training required

Optimized Performance with more Flexibility

  • Multiple settings for vacuum level, beam current and acceleration voltage to efficiently address diverse situations

Superb Images & Compositional Information

  • Backscatter and Secondary detection in high and low vacuum
  • No sample coating/preparation required

Complete Elemental Analysis system

  • Mapping, Spectrum, Line Scan, Reporting

Specifications

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