Easy and Intuitive Operation
- Optical navigation, image capture, report generation obtained quickly and easily with simplified workflow
- No special EM training required
Optimized Performance with more Flexibility
- Multiple settings for vacuum level, beam current and acceleration voltage to efficiently address diverse situations
Superb Images & Compositional Information
- Backscatter and Secondary detection in high and low vacuum
- No sample coating/preparation required
Complete Elemental Analysis system
- Mapping, Spectrum, Line Scan, Reporting
