There is a wide range of advanced electron microscopes such as Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM), Field-Emission Scanning Electron Microscopes (FE-SEM), Biological and Analytical Transmission Electron Microscopes (TEM), Scanning Transmission Electron Microscopes (STEM), and Tabletop Scanning Electron Microscopes. With overwhelming choices, we offer expertise in Tabletop Scanning Electron Microscopes.
Why Tabletop SEM?
Tabletop Scanning Electron Microscopes (SEM) feature improved electron optics, higher magnification, and built-in image processing to further enhance image quality and resolution. Tabletop microscopes offer an immediate micro-world experience with the convenience of a light microscope. In other words, you receive the abilities of a larger SEM but in a compact format that fits smaller workspaces. Additionally, with low vacuum imaging capabilities, even non-conductive samples, can be promptly observed without a metal coating.
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The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes ™ integrates ease of use, optimized imaging, and high-image quality while maintaining the compact design of well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 and TM4000Plus II.
Image Quality You Can See
Quality images can be obtained with simple steps.
- Automation, observation, and elemental analysis
- Easy to switch images with one-click
- Rapid acquisition of elemental maps (optional)
- Intuitive operation on Camera Navi (optional)
- The use of optical images helps navigate to the target observation area easily
- Obtained SEM images can be layered on an SEM MAP image
- Simply select images and a template to create customized reports
- Created reports can be saved/edited in Microscope Office formats
You receive various imaging applications using 4-under low vacuum status. With a charge-up reduction mode, your charge on a sample can be reduced with a single click. Under the low vacuum condition, you can examine a variety of materials as images show observations of non-conductive samples such as ink toner particles or a hydrated leaf surface.
You can use various imaging applications using 4-under low vacuum status with innovative secondary-electron detectors. The secondary-electron detectors obtain surface detail with non-conductive samples at lower vacuum conditions. The TM4000Plus II can observe not only conductive samples but also non-conductive or hydrated samples without sample preparation. Switching between BSE and SE can be performed easily.
Hitachi’s high-sensitivity low vacuum SE Detector (UVD) generates secondary-electron images by detecting visible light excited by electron gas interactions.
The advantages of 20 kV accelerating voltage enables you to have a higher-speed EDS analysis. EDS mapping data at 20kV is completed in just 2 minutes.
- Multi Zigzag
- A function that takes multiple high magnification images and stitches them together to create a single high-resolution image
- You can set matrix parameters for image array such as field of view, number of images, pitch, and overlay from the menu.
- STEM holder
- Easily obtain transmitted images on thin samples
- The newly developed STEM holder can be used to perform transmission images with the Hitachi UVD
- Images of thin or biological samples can be obtained