3D Surface Metrology Microscope DCM8
The 3D Surface Metrology Microscope DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Whether you are working in production or research, the DCM8 delivers accurate, repeatable metrological analysis results to optimize your material performance. DCM8 employs innovative HD micro-display scanning technology with no moving parts in the sensor head, you get fast, reproducible data captured.
Steep Slopes, Complex Shapes, Micro Peaks, and Valleys?
- Achieve vertical resolution up to 2 nm with HD confocal microscopy
- Choose from three interferometry modes for resolution up to 0.1nm:
- Vertical Scanning Interferometry (VSI)
- Phase Shift Interferometry (PSI)
- Extended PSI (ePSI)
- HD 2D images with brightfield or darkfield modes
- Integrated HD CDD camera has a large field of view allowing you to view more of your sample surface at once
- Large surface area? Select the ultra-fast XY topography stitching mode
Picture Worth A Thousand Words
By combining outstanding optics with an HD CDD camera, plus red, green, blue, and white LED light sources, the Leica DCM8 delivers impressive HD colour images. Pulsing the LEDs sequentially allows true colour information to be recorded in each pixel. Resolution and contrast are increased for crystal-clear visualization of your sample. The best part is the HD micro-display scanning technology, no moving parts, CCD camera, and 4 LEDs are housed in a sturdy yet compact sensor head providing you with durability and virtually maintenance-free operation.
Adapt, adapt, adapt
Configure the DCM8 to match your sample with reflective surfaces or surfaces below a transparent layer or samples requiring large working distances – whatever you need, we can get you the right objective. If you have larger samples, you can select from our range of adjustable columns and motorized stages.
Analyze the Results
- LeicaSCAN software allows you to control the DCM8
- Program parameters for repeat functionality
- Analyze multiple samples
- Optimize workflow with statistical analysis
- Or try the Leica Map software has a comprehensive set of advanced analysis tools
- If 2D is your priority, opt for Leica Application Suite for expanded system measurement capabilities